Wyniki wyszukiwania dla: Stefaan Van Huylenbroeck
SID Symposium Digest of Technical Papers > 54 > 1 > 25 - 28
SID Symposium Digest of Technical Papers > 53 > 1 > 748 - 751
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 549 - 559
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 402 - 412
Microelectronic Engineering > 2016 > 156 > C > 37-40
Microelectronics Reliability > 2014 > 54 > 9-10 > 1949-1952
2014 IEEE International Reliability Physics Symposium > 3E.1.1 - 3E.1.5
Thin Solid Films > 2012 > 520 > 8 > 3345-3348