Search results for: Kristof Croes
Microelectronics Reliability > 2017 > 79 > C > 297-305
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 549 - 559
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2306 - 2313
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-3.1 - 6B-3.8
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2488 - 2496
Microelectronic Engineering > 2016 > 156 > C > 70-77
Microelectronic Engineering > 2016 > 156 > C > 37-40
2016 IEEE International Reliability Physics Symposium (IRPS) > 5B-3-1 - 5B-3-8
Microelectronics Reliability > 2016 > 59 > C > 102-107
Microelectronics Reliability > 2016 > 56 > C > 93-100