Search results for: Hei Kam
2013 IEEE International Reliability Physics Symposium (IRPS) > 6A.1.1 - 6A.1.5
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 326 - 334
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 236 - 250
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 308 - 320
2010 International Electron Devices Meeting > 16.4.1 - 16.4.4
2010 International Electron Devices Meeting > 18.3.1 - 18.3.4
Proceedings of the IEEE > 2010 > 98 > 12 > 2076 - 2094
Journal of Microelectromechanical Systems > 2010 > 19 > 4 > 1012 - 1014
IEEE Electron Device Letters > 2010 > 31 > 4 > 371 - 373
IEEE Electron Device Letters > 2010 > 31 > 8 > 890 - 892
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3072 - 3082