Search results for: Vincent Pott
2012 IEEE International Reliability Physics Symposium (IRPS) > ME.3.1 - ME.3.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1207 - 1209
IEEE Electron Device Letters > 2012 > 33 > 9 > 1315 - 1317
IEEE Electron Device Letters > 2012 > 33 > 12 > 1759 - 1761
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1137 - 1143
Journal of Microelectromechanical Systems > 2010 > 19 > 4 > 1012 - 1014
IEEE Electron Device Letters > 2010 > 31 > 5 > 515 - 517
IEEE Electron Device Letters > 2010 > 31 > 8 > 890 - 892
Microelectronic Engineering > 2006 > 83 > 4-9 > 1718-1720