Search results for: T. Brodbeck
2009 31st EOS/ESD Symposium > 1 - 8
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.1-1 - 6A.1-10
Microelectronics Reliability > 2007 > 47 > 9-11 > 1539-1544
Nuclear Inst. and Methods in Physics Research, A > 2005 > 538 > 1-3 > 384-407
Microelectronics Reliability > 1999 > 39 > 11 > 1531-1540
Microelectronics Reliability > 1997 > 37 > 10-11 > 1465-1468
Microelectronics Reliability > 1996 > 36 > 11-12 > 1719-1722