Search results for: H. Gossner
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2607-2613
2011 International Reliability Physics Symposium > 3F.3.1 - 3F.3.5
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1597 - 1607
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1855 - 1863
EOS/ESD Symposium Proceedings > 1 - 8
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 411 - 418
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 309 - 317
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 318 - 326
2010 International Electron Devices Meeting > 35.4.1 - 35.4.4
2010 International SoC Design Conference > 268 - 271
2010 International SoC Design Conference > 264 - 267
Microelectronics Reliability > 2010 > 50 > 9-11 > 1359-1366
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2243 - 2250
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2235 - 2242
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 448 - 457
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465