Search results for: M. Chaine
2009 31st EOS/ESD Symposium > 1 - 7
2009 31st EOS/ESD Symposium > 1 - 10
Microelectronics Reliability > 2001 > 41 > 3 > 335-348
Microelectronics Reliability > 1999 > 39 > 11 > 1531-1540
Microelectronics Reliability > 1998 > 38 > 11 > 1749-1761