Search results for: Dawei Heh
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2599 - 2606
IEEE Electron Device Letters > 2010 > 31 > 7 > 653 - 655
Microelectronic Engineering > 2009 > 86 > 3 > 287-290
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1322 - 1329
IEEE Electron Device Letters > 2009 > 30 > 3 > 285 - 287
Microelectronics Reliability > 2007 > 47 > 4-5 > 479-488
IEEE Electron Device Letters > 2007 > 28 > 4 > 308 - 311