Search results for: C. Leyris
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2310 - 2316
Thin Solid Films > 2010 > 518 > 9 > 2497-2500
Solid State Electronics > 2009 > 53 > 7 > 730-734
IEEE Journal of Solid-State Circuits > 2009 > 44 > 9 > 2312 - 2321
Microelectronics Reliability > 2007 > 47 > 4-5 > 573-576
Microelectronics Reliability > 2007 > 47 > 1 > 41-45
Microelectronic Engineering > 2005 > 80 > Complete > 54-57