Search results for: M. Ciappa
Solid State Electronics > 2015 > 113 > Complete > 73-78
Microelectronics Reliability > 2014 > 54 > 9-10 > 1856-1861
Radiation Physics and Chemistry > 2012 > 81 > 8 > 1270-1275
Microelectronics Reliability > 2011 > 51 > 9-11 > 1479-1483
2011 International Reliability Physics Symposium > 2B.1.1 - 2B.1.8
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 349 - 357
Journal of Microelectromechanical Systems > 2011 > 20 > 3 > 609 - 621
2010 15th IEEE European Test Symposium > 170 - 174
Microelectronics Reliability > 2008 > 48 > 8-9 > 1500-1504
2008 IEEE Power Electronics Specialists Conference > 2600 - 2606