Search results for: H. Rothleitner
2011 International Reliability Physics Symposium > 2B.1.1 - 2B.1.8
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 349 - 357
2010 15th IEEE European Test Symposium > 170 - 174
CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. > 2 > 335 - 338 vol. 2