Search results for: Lingpeng Guan
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 69 - 73
IEEE Transactions on Electron Devices > 2010 > 57 > 12 > 3531 - 3535
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2144 - 2149
IEEE Electron Device Letters > 2008 > 29 > 4 > 375 - 377
IEEE Transactions on Electron Devices > 2007 > 54 > 7 > 1789 - 1792
IEEE Electron Device Letters > 2006 > 27 > 11 > 920 - 922