Search results for: H. Gieser
2009 31st EOS/ESD Symposium > 1 - 8
2006 1st Electronic Systemintegration Technology Conference > 2 > 947 - 953
Microelectronics Reliability > 2006 > 46 > 9-11 > 1629-1633
Microelectronics Reliability > 2006 > 46 > 5-6 > 666-676
Microelectronics Reliability > 2005 > 45 > 2 > 269-277
Microelectronics Reliability > 2005 > 45 > 2 > 297-304
Journal of Electrostatics > 2004 > 62 > 2-3 > 133-153