Search results for: N. Collaert
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1272 - 1278
Microelectronics Reliability > 2012 > 52 > 1 > 118-123
Solid State Electronics > 2011 > 65-66 > Complete > 205-210
Solid State Electronics > 2011 > 62 > 1 > 146-151
Solid State Electronics > 2011 > 59 > 1 > 18-24
2011 International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
Solid State Electronics > 2011 > 57 > 1 > 31-34
IEEE Electron Device Letters > 2011 > 32 > 4 > 440 - 442
2010 International Electron Devices Meeting > 16.6.1 - 16.6.3
2010 International Electron Devices Meeting > 12.3.1 - 12.3.4
Solid State Electronics > 2010 > 54 > 12 > 1592-1597
Microelectronic Engineering > 2010 > 87 > 9 > 1764-1768