Search results for: L.-A. Ragnarsson
IEEE Electron Device Letters > 2007 > 28 > 7 > 656 - 658
IEEE Electron Device Letters > 2007 > 28 > 6 > 486 - 488
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2738 - 2749
Materials Science in Semiconductor Processing > 2006 > 9 > 6 > 880-884
Materials Science & Engineering R > 2006 > 51 > 4-6 > 37-85
IEEE Transactions on Electron Devices > 2006 > 53 > 7 > 1657 - 1668
Microelectronic Engineering > 2005 > 80 > Complete > 86-89
Microelectronic Engineering > 2005 > 80 > Complete > 82-85
Microelectronics Reliability > 2005 > 45 > 5-6 > 794-797
Microelectronics Reliability > 2005 > 45 > 5-6 > 786-789
Microelectronics Reliability > 2005 > 45 > 5-6 > 779-782
Microelectronics Reliability > 1998 > 38 > 6-8 > 1109-1113
Microelectronic Engineering > 1997 > 36 > 1-4 > 53-60