Search results for: L.-A. Ragnarsson
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-2-1 - 4B-2-7
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
2014 IEEE International Electron Devices Meeting > 34.4.1 - 34.4.4
2014 IEEE International Reliability Physics Symposium > 3C.4.1 - 3C.4.6
Microelectronic Engineering > 2013 > 109 > Complete > 109-112
Solid State Electronics > 2013 > 84 > Complete > 22-27