Search results for: L. Trojman
Microelectronic Engineering > 2017 > 178 > C > 42-47
Solid-State Electronics > 2017 > 132 > C > 49-56
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
2016 IEEE ANDESCON > 1 - 4
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 98 - 100
Microelectronic Engineering > 2015 > 147 > C > 72-74
2015 IEEE International Reliability Physics Symposium > 3B.5.1 - 3B.5.6
Microelectronic Engineering > 2013 > 107 > Complete > 1-5
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3009 - 3017
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3414 - 3420
IEEE Electron Device Letters > 2008 > 29 > 9 > 1056 - 1058
Microelectronic Engineering > 2007 > 84 > 9-10 > 2058-2062
Microelectronic Engineering > 2007 > 84 > 9-10 > 1878-1881
Microelectronic Engineering > 2007 > 84 > 9-10 > 1882-1885
IEEE Transactions on Electron Devices > 2007 > 54 > 3 > 497 - 503