Search results for: V. De Heyn
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Transactions on Circuits and Systems I: Regular Papers > 2007 > 54 > 11 > 2541 - 2551
IEEE Journal of Solid-State Circuits > 2007 > 42 > 12 > 2860 - 2869
IEEE Journal of Solid-State Circuits > 2007 > 42 > 11 > 2515 - 2527
Microelectronics Reliability > 2005 > 45 > 2 > 269-277
Journal of Electrostatics > 2004 > 62 > 2-3 > 133-153
Microelectronics Reliability > 2003 > 43 > 7 > 1011-1020
Microelectronics Reliability > 2002 > 42 > 6 > 901-907
Microelectronics Reliability > 2001 > 41 > 3 > 375-383