Search results for: G. Groeseneken
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-1.1 - 5A-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-1.1 - 4C-1.7
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6
2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.6.1 - 15.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 31.4.1 - 31.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.5.1 - 15.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.6.1 - 4.6.4
Solid-State Electronics > 2016 > 125 > C > 52-62
Solid-State Electronics > 2016 > 125 > C > 198-203
IEEE Electron Device Letters > 2016 > 37 > 9 > 1112 - 1115