Search results for: Binit Syamal
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1702 - 1707
IEEE Electron Device Letters > 2016 > 37 > 8 > 1051 - 1054
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1478 - 1485
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 314 - 323
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 63 - 69
Microelectronics Reliability > 2012 > 52 > 11 > 2572-2578
Microelectronics Reliability > 2012 > 52 > 6 > 984-988
Solid State Electronics > 2011 > 63 > 1 > 177-183
Solid State Electronics > 2011 > 56 > 1 > 148-154