Search results for: Joke De Messemaeker
Microelectronics Reliability > 2017 > 79 > C > 297-305
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 549 - 559
physica status solidi c > 14 > 7 > n/a - n/a
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
Microelectronics Reliability > 2015 > 55 > 5 > 765-770
2014 IEEE International Reliability Physics Symposium > 3E.1.1 - 3E.1.5
Scripta Materialia > 2002 > 47 > 1 > 13-18