Search results for: Jiun-Lang Huang
Journal of Electronic Testing > 2016 > 32 > 5 > 625-638
Journal of Electronic Testing > 2015 > 31 > 5-6 > 549-559
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 1 > 165 - 169
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 3 > 465 - 474