Search results for: S. Demuynck
2016 IEEE International Electron Devices Meeting (IEDM) > 17.5.1 - 17.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
2015 IEEE International Electron Devices Meeting (IEDM) > 21.8.1 - 21.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2015 IEEE International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.5