Search results for: D. Yakimets
IEEE Electron Device Letters > 2017 > 38 > 1 > 9 - 11
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4
IEEE Electron Device Letters > 2017 > 38 > 1 > 9 - 11
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4