Wyniki wyszukiwania dla: P.M. Lenahan
Journal of Magnetic Resonance > 2008 > 195 > 1 > 17-22
Microelectronics Reliability > 2007 > 47 > 6 > 890-898
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 540 - 557
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 117 - 122