Search results for: S. Haendler
Solid-State Electronics > 2017 > 128 > C > 31-36
Microelectronic Engineering > 2016 > 159 > C > 9-16
Solid-State Electronics > 2016 > 118 > C > 4-11
Solid-State Electronics > 2016 > 117 > C > 88-93
Solid-State Electronics > 2015 > 111 > C > 123-128
IEEE Electron Device Letters > 2015 > 36 > 5 > 433 - 435
2014 IEEE International Electron Devices Meeting > 3.9.1 - 3.9.3
Microelectronics Reliability > 2014 > 54 > 9-10 > 2171-2175
2014 IEEE International Reliability Physics Symposium > CA.10.1 - CA.10.6