Search results for: C. Adelmann
Microelectronic Engineering > 2018 > 187-188 > C > 144-147
Microelectronic Engineering > 2017 > 178 > C > 145-149
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-2.1 - 6B-2.8
2015 IEEE International Electron Devices Meeting (IEDM) > 32.5.1 - 32.5.4
Microelectronic Engineering > 2015 > 147 > C > 108-112
Microelectronic Engineering > 2014 > 120 > Complete > 246-250
2013 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4
Microelectronic Engineering > 2013 > 112 > Complete > 92-96
Applied Surface Science > 2013 > 281 > Complete > 8-16
Surface and Interface Analysis > 45 > 1 > 394 - 397
Microelectronic Engineering > 2012 > 90 > Complete > 138-140