Search results for: X. Zhang
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 471 - 476
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 170 - 175
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 285 - 292
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1193 - 1196
2015 IEEE SENSORS > 1 - 4
2013 IEEE International Reliability Physics Symposium (IRPS) > SE.8.1 - SE.8.6
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4470 - 4475