Search results for: B. Vandevelde
Microelectronics Reliability > 2017 > 76-77 > C > 42-46
Microelectronics Reliability > 2016 > 59 > C > 108-116
2015 IEEE International Reliability Physics Symposium > 4C.5.1 - 4C.5.10
Microelectronic Engineering > 2014 > 120 > Complete > 85-89
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3055 - 3060
2013 IEEE International Reliability Physics Symposium (IRPS) > 5C.2.1 - 5C.2.6
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4