Search results for: K. De Meyer
Microelectronic Engineering > 2017 > 178 > C > 93-97
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 130 - 136
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2015 IEEE International Electron Devices Meeting (IEDM) > 3.1.1 - 3.1.4
2014 IEEE International Electron Devices Meeting > 30.2.1 - 30.2.4