Search results for: J. Lee
Electronics Letters > 2017 > 53 > 2 > 62 - 64
IEEE Electron Device Letters > 2011 > 32 > 5 > 674 - 676
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 74 - 79
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
2008 Design, Automation and Test in Europe > 1172 - 1177
IEEE Transactions on Nanotechnology > 2007 > 6 > 4 > 431 - 437
IEEE Custom Integrated Circuits Conference 2006 > 687 - 690