Search results for: Kuniyuki Kakushima
Journal of Electronic Materials > 2018 > 47 > 7 > 3497-3501
Solid-State Electronics > 2017 > 138 > C > 35-39
IEEE Electron Device Letters > 2017 > 38 > 8 > 1101 - 1104
Microelectronics Reliability > 2017 > 68 > C > 86-90
IEEE Electron Device Letters > 2016 > 37 > 5 > 618 - 620
Topics in Applied Physics > Rare Earth Oxide Thin Films > 345-365
Thin Solid Films > 2016 > 600 > C > 30-35
Electronics Letters > 2016 > 52 > 1 > 59 - 61
physica status solidi (a) > 212 > 5 > 1104 - 1109
Microelectronic Engineering > 2015 > 138 > Complete > 111-117