Search results for: Cristian Zambelli
IEEE Electron Device Letters > 2018 > 39 > 1 > 27 - 30
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 713 - 721
Proceedings of the IEEE > 2017 > 105 > 9 > 1589 - 1608
Proceedings of the IEEE > 2017 > 105 > 9 > 1790 - 1811
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-5.1 - PM-5.4
Solid-State Electronics > 2017 > 128 > C > 187-193
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 64 - 68
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 413 - 418
2016 IEEE International Reliability Physics Symposium (IRPS) > 2B-3-1 - 2B-3-6
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1516 - 1523
Solid-State Electronics > 2016 > 115 > PA > 17-25
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 529 - 535
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 10 > 1627 - 1638