Wyniki wyszukiwania dla: Michel Renovell
Journal of Electronic Testing > 2019 > 35 > 1 > 59-75
Journal of Electronic Testing > 2018 > 34 > 2 > 123-134
Journal of Electronic Testing > 2017 > 33 > 4 > 515-527
IEEE Transactions on Nanotechnology > 2017 > 16 > 3 > 417 - 430
2016 17th Latin-American Test Symposium (LATS) > 129 - 134
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 1 > 378 - 382
Microelectronics Journal > 2015 > 46 > 11 > 1091-1102
Microelectronics Journal > 2014 > 45 > 10 > 1348-1353
Microelectronics Journal > 2014 > 45 > 3 > 336-344