Search results for: Jean-Marc Galliere
Journal of Electronic Testing > 2019 > 35 > 1 > 59-75
Journal of Electronic Testing > 2018 > 34 > 2 > 123-134
Journal of Electronic Testing > 2017 > 33 > 4 > 515-527
IEEE Transactions on Nanotechnology > 2017 > 16 > 3 > 417 - 430
2016 17th Latin-American Test Symposium (LATS) > 129 - 134
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2386 - 2391
IEEE Transactions on Nuclear Science > 2013 > 60 > 5-2 > 3603 - 3608