Search results for: Isabella Rossetto
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
Microelectronics Reliability > 2017 > 76-77 > C > 282-286
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-2.1 - 3B-2.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-5.1 - 4B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
Microelectronics Reliability > 2016 > 64 > C > 547-551
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2334 - 2339
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2830 - 2836
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2549 - 2554
2014 IEEE International Reliability Physics Symposium > 6C.6.1 - 6C.6.7