Search results for: Ph. Galy
Microelectronic Engineering > 2017 > 178 > C > 245-249
IEEE Electron Device Letters > 2017 > 38 > 2 > 157 - 159
Solid State Electronics > 2013 > 89 > Complete > 17-21
CAS 2013 (International Semiconductor Conference) > 2 > 171 - 174
Microelectronics Reliability > 2013 > 53 > 9-11 > 1284-1287
Microelectronics Reliability > 2012 > 52 > 9-10 > 1998-2004
Microelectronics Reliability > 2011 > 51 > 9-11 > 1608-1613