Search results for: J. Bourgeat
CAS 2013 (International Semiconductor Conference) > 2 > 171 - 174
Microelectronics Reliability > 2013 > 53 > 9-11 > 1284-1287
Microelectronics Reliability > 2012 > 52 > 9-10 > 1998-2004
Microelectronics Reliability > 2011 > 51 > 9-11 > 1614-1617
Microelectronics Reliability > 2011 > 51 > 9-11 > 1608-1613
EOS/ESD Symposium Proceedings > 1 - 6
Microelectronics Reliability > 2010 > 50 > 9-11 > 1379-1382
2009 31st EOS/ESD Symposium > 1 - 8