Search results for: Michael Nicolaidis
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 1 - 2
IEEE Transactions on Computers > 2016 > 65 > 7 > 2284 - 2298
Frontiers in Electronic Testing
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 10 - 23
Microprocessors and Microsystems > 2014 > 38 > 6 > 620-635