Search results for: T. Cabout
2013 IEEE International Electron Devices Meeting > 30.2.1 - 30.2.4
2013 5th IEEE International Memory Workshop > 116 - 119
Thin Solid Films > 2013 > 533 > Complete > 19-23
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.4.1 - 5E.4.4
2011 International Electron Devices Meeting > 28.7.1 - 28.7.4