Search results for: L. Perniola
Microelectronics Reliability > 2017 > 76-77 > C > 178-183
Microelectronic Engineering > 2017 > 178 > C > 61-65
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-2.1 - PM-2.5
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2038 - 2045
2016 IEEE International Electron Devices Meeting (IEDM) > 16.6.1 - 16.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.7.1 - 4.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.5.1 - 4.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 27.3.1 - 27.3.4
Solid-State Electronics > 2016 > 125 > C > 182-188