Search results for: Eric Beyne
Microelectronics Reliability > 2018 > 87 > C > 97-105
Microelectronics Reliability > 2017 > 79 > C > 297-305
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 11 > 1899 - 1905
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 549 - 559
Applied Surface Science > 2017 > 404 > C > 82-87
Microelectronic Engineering > 2017 > 167 > C > 10-16
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 2 > 221 - 228