Search results for: P. Vanmeerbeek
2015 IEEE International Electron Devices Meeting (IEDM) > 35.2.1 - 35.2.4
2015 IEEE International Reliability Physics Symposium > 2E.2.1 - 2E.2.6
Microelectronics Reliability > 2012 > 52 > 9-10 > 2409-2413
Microelectronics Reliability > 2011 > 51 > 9-11 > 1959-1963
Microelectronics Reliability > 2010 > 50 > 9-11 > 1758-1762
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 516 - 523
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 435 - 445
Microelectronics Reliability > 2007 > 47 > 9-11 > 1389-1393
IEEE Electron Device Letters > 2007 > 28 > 5 > 416 - 418
Physica B: Physics of Condensed Matter > 2006 > 376-377 > Complete > 113-116
Physica B: Physics of Condensed Matter > 2003 > 340-342 > Complete > 795-798