Search results for: Chun-Hsing Shih
Materials Science in Semiconductor Processing > 2017 > 70 > C > 272-278
Microelectronics Reliability > 2017 > 74 > C > 9-14
Journal of Computational Electronics > 2017 > 16 > 3 > 696-703
Superlattices and Microstructures > 2017 > 102 > Complete > 284-299
Superlattices and Microstructures > 2016 > 100 > C > 857-866
Microelectronics Reliability > 2015 > 55 > 1 > 31-37
Microelectronics Reliability > 2015 > 55 > 1 > 74-80
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1907 - 1913
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1361 - 1368
IEEE Journal of the Electron Devices Society > 2014 > 2 > 5 > 128 - 132