Search results for: Valentin Gherman
Journal of Electronic Testing > 2014 > 30 > 2 > 183-192
Journal of Electronic Testing > 2013 > 29 > 4 > 601-608
Journal of Electronic Testing > 2014 > 30 > 2 > 183-192
Journal of Electronic Testing > 2013 > 29 > 4 > 601-608