Search results for: C. Claeys
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Radiation Effects > 221-226
Thin Solid Films > 2012 > 520 > 8 > 3337-3340
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Electron Device Letters > 2011 > 32 > 1 > 87 - 89
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1933 - 1939
IEEE Transactions on Electron Devices > 2010 > 57 > 12 > 3303 - 3311
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1771 - 1776
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141