Search results for: Yervant Zorian
IEEE Design & Test > 2017 > 34 > 1 > 6 - 7
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 3 - 9
IEEE Design & Test > 2014 > 31 > 2 > 6 - 8
AT&T Technical Journal > 1990 > 69 > 3 > 97 - 109
AT&T Technical Journal > 1994 > 73 > 2 > 30 - 39