Search results for: M.A. Pavanello
Microelectronics Reliability > 2017 > 79 > C > 111-118
Electronics Letters > 2016 > 52 > 23 > 1935 - 1937
Microelectronics Reliability > 2016 > 63 > C > 1-10
Solid-State Electronics > 2016 > 122 > C > 23-31
Solid-State Electronics > 2015 > 111 > C > 196-203
Solid State Electronics > 2014 > 94 > Complete > 91-97
Solid State Electronics > 2013 > 85 > Complete > 59-63
Cryogenics > 2009 > 49 > 11 > 590-594
Microelectronic Engineering > 2007 > 84 > 9-10 > 2121-2124
Solid State Electronics > 2007 > 51 > 2 > 285-291