Search results for: V.V.N. Obreja
Microelectronics Reliability > 2011 > 51 > 3 > 536-542
2009 International Semiconductor Conference > 2 > 451 - 454
2008 International Semiconductor Conference > 2 > 321 - 324
2007 International Semiconductor Conference > 2 > 485 - 488
2006 International Semiconductor Conference > 2 > 359 - 362
2006 International Semiconductor Conference > 2 > 305 - 308
2006 1st Electronic Systemintegration Technology Conference > 2 > 1230 - 1235
2006 1st Electronic Systemintegration Technology Conference > 1 > 307 - 312
2006 IEEE International Symposium on Industrial Electronics > 2 > 835 - 840