Search results for: P. Zaumseil
Journal of Raman Spectroscopy > 51 > 6 > 989 - 996
Engineering Materials and Processes > Materials for Information Technology > Advanced Materials Characterization > 497-505
Microelectronic Engineering > 2012 > 97 > Complete > 169-172
Thin Solid Films > 2012 > 520 > 14 > 4532-4535
Surface and Interface Analysis > 43 > 4 > 827 - 835
Microelectronic Engineering > 2009 > 86 > 7-9 > 1615-1620
Journal of Electronic Materials > 2009 > 38 > 6 > 797-801
Thin Solid Films > 2008 > 517 > 1 > 259-261
Materials Science & Engineering C > 2007 > 27 > 5-8 > 1154-1157
Materials Science & Engineering B > 2006 > 134 > 2-3 > 125-129
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1937 - 1939
Microelectronic Engineering > 2005 > 82 > 2 > 148-153
Journal of Alloys and Compounds > 2005 > 401 > 1-2 > 254-260
Microelectronic Engineering > 2005 > 80 > Complete > 313-316